Contact
- e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.
- tel: 381 (18) 529-327
Academic carreer
- Selected as a teaching assistant in 2023 at the Faculty of Electronic Engineering in Nis, in the field of Microelectronics and Microsystems
- Received her master's degree in 2019 at the Faculty of Electronic Engineering in Nis, in the field of Electronics and Microsystems
- Graduated in 2018 at the Faculty of Electronic Engineering in Nis, in the field of Electronic Components and Microsystems
Selected references
- Miloš Marjanović, Stefan D. Ilić, Sandra Veljković, Nikola Mitrović, Umutcan Gurer, Ozan Yilmaz, Aysegul Kahraman, Aliekber Aktag, Huseyin Karacali, Erhan Budak, Danijel Danković, Goran Ristić and Ercan Yilmaz, “The SPICE Modeling of a Radiation Sensor Based on a MOSFET with a Dielectric HfO2/SiO2 Double-Layer”, Sensors, vol. 25, no. 2, p. 546-1-16 (2025), ISSN 1424-8220 (Electronic), DOI: 10.3390/s25020546, https://www.mdpi.com/1424-8220/25/2/546.
- Sandra Veljković, Nikola Mitrović, Vojkan Davidović, Emilija Živanović, Goran Ristić, Danijel Danković, “Successive Irradiation and Bias Temperature Stress Induced Eeffects on Commercial p-Channel Power VDMOS Transistors”, Facta Universitatis, Series: Electronics and Energetics, vol. 37, no. 4, pp. 561-579 (2024), ISSN 0353-3670 (Print), 2217-5997 (Electronic), DOI: 10.2298/FUEE2404561V, https://casopisi.junis.ni.ac.rs/index.php/FUElectEnerg/article/view/12392/5512.
- Emilija Živanović, Sandra Veljković, Nikola Mitrović, Igor Jovanović, Snežana Đorić Veljković, Albena Paskaleva, Dencho Spassov, Danijel Danković, “A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress“, Micromachines, vol. 15, no. 4, pp. 503-1-15 (2024), ISSN: 2072-666X (Electronic), DOI: 10.3390/mi15040503, https://www.mdpi.com/2072-666X/15/4/503.
- Sandra Veljković, Nikola Mitrović, Vojkan Davidović, Albena Paskaleva, Dencho Spassov, Igor Jovanović, Emilija Živanović, Goran Ristić, Danijel Danković, “The effects of NBT stressing on later operation of power VDMOS transistors under normal conditions”, Proc. 35th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2024), Parma, Italy, 23-26 September 2024, pp. 1-4.
- Sandra Veljković, Nikola Mitrović, Emilija Živanović, Miloš Marjanović, Vojkan Davidović, Goran Ristić, Danijel Danković, “Assessment of NBT Stressing Impact on the Continuous Operation of Power VDMOS Transistor”, 12th International Conference on Radiation in Various Fields of Research (RAD 2024), 17-21 June 2024, Herceg Novi, Montenegro, p. 189, DOI: 10.21175/rad.abstr.book.2024.35.21, https://www.rad-conference.org/RAD_2024-Book_of_Abstracts.pdf.
- Miloš Marjanović, Sandra Veljković, Nikola Mitrović, Emilija Živanović, Aleksandar Gavrić, Danijel Danković, “Modified SPICE-Compatible Model Integrating NBTI and Self-Heating Effects for VDMOS Transistors”, Proc. 11th International Conference on Electrical, Electronics and Computer Engineering (IcETRAN), Niš, Serbia, 3-6 June 2024, p. 1-6, DOI: 10.1109/IcETRAN62308.2024.10645094. https://ieeexplore.ieee.org/document/10645094
- Nikola Mitrović, Antonio Pousibet-Garrido, Sandra Veljković, Isidoro Ruiz-Garcia, Danijel Danković, Alberto J. Palma, Goran Ristić, Miguel A Carvajal, “NFC Implementation Methods for ESP32 Based IoT Systems”, 16th IEEE International Conference on Advanced Technologies, Systems and Services in Telecommunications (TELSIKS 2023), Niš, Serbia, 25-27 October 2023, pp. 266-269, ISBN: 979-8-3503-4702-9, DOI: 10.1109/TELSIKS57806.2023.10316112, https://ieeexplore.ieee.org/document/10316112.
- Sandra Veljković, Nikola Mitrović, Igor Jovanović, Emilija Živanović, Albena Paskaleva, Goran Ristić, Danijel Danković, “Effects of self-heating and NBTI-induced stress on p-channel power VDMOSFETs”, 11th International Conference on Radiation in Various Fields of Research (RAD 2023), 13-17 June 2023, Herceg Novi, Montenegro, p. 191, ISBN:978-86-901150-6-8, https://doi.org/10.21175/rad.abstr.book.2023.33.4
- Sandra Veljković, Nikola Mitrović, Igor Jovanović, Emilija Živanović, Albena Paskaleva, Dencho Spassov, Dragan Mančić, Danijel Danković, “Self-heating of stressed VDMOS devices under specific operating conditions“, Microelectronics Reliability, vol. 150, no. 11, pp. 115213-1-6 (2023), ISSN: 0026-2714 (Electronic), DOI: 10.1016/j.microrel.2023.115213, https://www.sciencedirect.com/science/article/pii/S002627142300313X.
- Sandra Veljković, Nikola Mitrović, Vojkan Davidović, Snežana Golubović, Snežana Djorić-Veljković, Albena Paskaleva, Dencho Spassov, Srboljub Stanković, Marko Andjelković, Zoran Prijić, Ivica Manić, Aneta Prijić, Goran Ristić, Danijel Danković, “Response of Commercial p-Channel Power VDMOS Transistors to Irradiation and Bias Temperature Stress”, Journal of Circuits, Systems, and Computers, vol. 31, no. 18, pp. 2240003-1-25 (2022), ISSN: 0218-1266 (Electronic), DOI: 10.1142/S0218126622400035, https://www.worldscientific.com/doi/10.1142/S0218126622400035?srsltid=AfmBOor7_s-Fp6fLHPvuUVLMnh64yPrJMsjvER3nTYOJhttF2m1jxhUo.
- Goran S. Ristić, Stefan D. Ilić, Sandra Veljković, Aleksandar S. Jevtić, Strahinja Dimitrijević, Alberto J. Palma, Srboljub Stanković, Marko S. Andjelković, “Commercial p-Channel Power VDMOSFET as X-ray Dosimeter”, Electronics, vol. 11, no. 6, March 2022, pp. 918-1-12, ISSN: 2079-9292, DOI: 10.3390/electronics11060918, https://doi.org/10.3390/electronics11060918.
- Danijel Danković, Vojkan Davidović, Snežana Golubović, Sandra Veljković, Nikola Mitrović, Sežana Djorić-Veljković, “Radiation and annealing related effects in NBT stressed P-channel power VDMOSFETs”, Microelectronics Reliability, vol. 126, November 2021, pp. 114273-1-5, ISSN: 0026-2714, DOI: 10.1016/j.microrel.2021.114273, https://doi.org/10.1016/j.microrel.2021.114273.
Activities
- Total number of scientific papers with IMPACT factor: 12
- Current involvement in projects: National: 1, International: 2
- Other relevant information: Member of the SSCS Chapters Steering Committee, Chair of the IEEE ED/SSC University of Niš Student Branch Chapter, and a member of the Institute of Electrical and Electronics Engineers (IEEE) and the Serbian Ceramic Society (SKD). Additionally, she serves as a student representative of Region 8 in the SSCS Ad Hoc Committee and as the European Chair for the Arduino Contest. She is also a member of the Secretariat of the IEEESTEC student project conference and the international MIEL conference.